论文详情
氩离子抛光—场发射扫描电镜分析方法在识别有机显微组分中的应用
石油实验地质
2021年 43卷 第2期
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Title
Ar-ion polishing FE-SEM analysis of organic maceral identification
作者
高凤琳
王成锡
宋岩
陈振宏
刘庆新
李卓
姜振学
张欣欣
Authors
GAO Fenglin
WANG Chengxi
SONG Yan
CHEN Zhenhong
LIU Qingxin
LI Zhuo
JIANG Zhenxue
ZHANG Xinxin
单位
中国地质调查局 发展研究中心, 北京 100037
中国石油大学(北京) 油气资源与探测国家重点实验室, 北京 102249
中国石油勘探开发研究院, 北京 100083
东北石油大学 非常规油气研究院, 黑龙江 大庆 163318
中国科学院 地质与地球物理研究所, 北京 100029
Organization
Development and Research Center, China Geological Survey, Beijing 100037, China
State Key Laboratory of Petroleum Resources and Prospecting, China University of Petroleum, Beijing 102249, China
Research Institute of Petroleum Exploration & Development, PetroChina, Beijing 100083, China
Institute of Unconventional Oil & Gas, Northeast Petroleum University, Daqing, Heilongjiang 163318, China
Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing 100029, China
摘要
氩离子抛光—场发射扫描电镜是页岩储层微观孔隙结构表征的常用手段,但单独依靠扫描电镜观察无法直接识别有机质类型,而荧光显微镜是鉴定显微组分的主要方法。通过大量场发射扫描电镜与荧光显微镜相结合的定位观察技术,实现对扫描电镜下特定显微组分的鉴定和观察,并总结出扫描电镜下有机显微组分鉴定的方法和特征。氩离子抛光—场发射扫描电镜下,可通过有机质的外部形态、硬度、亮度、颜色、突起、有机质孔隙发育特征以及裂隙发育特征等综合判断出结构镜质体、无结构镜质体、镜屑体、丝质体、半丝质体、菌类分泌体、惰屑体、油沥青以及焦沥青。
Abstract
Argon-ion polishing field emission-scanning electron microscopy (FE-SEM) is a common method to characterize the microscopic pore structure characteristics of shale reservoirs, but organic macerals cannot be directly identified by FE-SEM alone. Fluorescence microscopy is the main method for identifying macerals. Through a large number of localized FE-SEM and fluorescence microscopy observations, the microscopic characteristics of specific macerals under FE-SEM were summarized. The macerals visualized using FE-SEM can be interpreted based on features such as the external shape, hardness, brightness, color, relief, organic pore development characteristics and fissure development characteristics of the organic matter. Telinite, collotelinite, vitrodetrinite, fusinite, semifusinite, funginite, inertodetrinite, oil bitumen and pyrobitumen were identified.
关键词:
氩离子抛光;
场发射扫描电镜;
有机显微组分;
Keywords:
argon-ion polishing;
FE-SEM;
organic macerals;
基金项目
中国地质调查局项目“地学信息产品开发与社会化服务” DD20190405;国家科技重大专项 2016ZX05034001-005
DOI
https://doi.org/10.11781/sysydz202102360